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Showing results: 976 - 990 of 17041 items found.

  • Cleanliness Test Systems

    CM Series - Gen3 systems

    The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.

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  • Carrier with System Management

    EnsembleSeries™ CCM3012 - Mercury Systems, Inc.

    *PCIe Gen-3 interfaces to OpenVPX data plane*Advanced system management built-in (VITA 46.11)*Air, conduction, Air and Liquid Flow-By packages*Interoperable with other Ensemble OpenVPX processing modules*Fully MultiCore Plus® compatible

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  • X-ray Inspection System

    JewelBox 90T - Glenbrook Technologies

    The Jewel Box 90-T delivers precision x-ray images of ultra-high resolution and grey scale accuracy without the aberrations of voltage blooming and pincushioning prevalent in other systems. Glenbrook?s patented, award-winning MXRA® x-ray camera technology.

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  • Battery Monitoring System

    S5 - BTECH, Inc.

    BTECH's benchmark product designed for a wide variety of applications (UPS/Telco/Switchgear), the S5 can collect data from any battery type including cells with the highest amp hour rating (4000+), and the S5 systems will record all battery parameters.

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  • Integrated UHPLC Systems

    LC-4000 Series - Jasco Analytical Instruments

    The LC-4000 Series UHPLC system offers high performance separations at up to 130MPa (around 20,000psi) for use with the smallest particle sizes and longest column lengths. The pump, autosampler and detectors are optimized for the smallest band broadening and fastest cycle times.

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  • Integrated Bonding Systems

    EV Group

    EVG offers fully integrated and highly automated production systems for wafer bonding processes. A maximum level of automation and process integration opens the door to large-scale manufacturing and guarantees a proven transition of processes from R&D stage to production.

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  • Interference Locating System

    SeeWave® - PCTEL, Inc

    Interference impacts wireless network coverage and quality of service, but hunting interference in the field can be expensive and time-consuming. PCTEL’s SeeWave® interference locating system enables a single user to accurately detect the interfering frequency and locate its exact source.

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  • Defect Inspection System

    NovusEdge - Onto Innovation

    The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.

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  • CrystalCalHP Calibration System

    AMETEK Sensors, Test & Calibration

    This portable gauge and transmitter calibration system is 7 to 10 times faster than a deadweight tester. It allows you to do a 10 point up and down calibration in less than 3 minutes including printing out a calibration certificate.

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  • Precision Targeting Systems

    Elbit Systems of America®

    Designed to meet the various missions of the United States military, the Common Laser Range Finder-Integrated Capability (CLRF-IC) provides rugged day and night capabilities for reconnaissance, surveillance, and targeting operations. Within a three pound package, the CLRF-IC employs the latest in advanced and lightweight handheld technologies. Featuring a Single Wave-IR night camera, high definition color day camera, eye-safe laser rangefinder, digital magnetic compass and a global positioning system, CLRF-IC increases precision targeting capabilities. Powered by either L91 or CR123 batteries, the system recognizes targets over 3 kilometers in day light and1 kilometer at night.

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  • Data Acquisition System

    Ajinkya Electronic Systems

    Available with us is Data Acquisition system that includes data loggers, scanners, various instruments spread all over the plant, SCADA / Monitoring Software on central PC and multiple SCADA software running along the plant under supervision of central PC. We offer data loggers and other instruments support MODBUS communication protocol that can be connected on a data acquisition bus if it is running on MODBUS protocol. Most of the popular SCADA software available support MODBUS communication. We have a wide range of products apart from Data loggers, Scanners and Event Loggers which can be part of data acquisition and control system, such as

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  • Electrical Probe Systems

    Instec, Inc.

    INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

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  • Bond Alignment Systems

    EV Group

    With the invention of the world’s first double sided alignment system in 1985, EV Group has revolutionized MEMS technology and set worldwide industry standards in aligned wafer bonding by separating the alignment and bonding process. This process separation results in higher flexibility and universal application of the wafer bonding equipment. The EVG bond alignment systems offer highest precision, flexibility, ease of use and modular upgrade capability and have been qualified in numerous high throughput production environments. The precision of EVG bond aligners accommodates most demanding alignment processes in MEMS production and in emerging fields like 3D integration applications.

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  • Ferroelectric Test System

    LCII - Radiant Technologies, Inc.

    Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.

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  • SSD Test Systems

    Advantest Corp.

    Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.

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